Last updated: 10/25/2022
tentative schedule subject to change
Wednesday, October 26 – Benefit Golf Tournament
Thursday, October 27
10:00 – 17:00 | Attendee Registration Open |
10:00 – 13:00 | Exhibitor Registration Open |
12:00 – 14:00 | Exhibitor Registration Open Exhibitor Setup in Expo Hall for 34 Booths – Exhibitors Only |
13:00 – 13:15 Space Available Seating | Chairman’s Welcome to SWTest Asia 2022 Opening Remarks Dr. Jerry Broz, SWTest General Chair Clark Liu, SWTest Technical Program Chair |
Technical Session 1: Getting Manufacturing Smarter
Session Chair: Clark Liu (MJC Taiwan – Taiwan)
13:15 – 13.45 Space Available Seating | Probecard Challenges for Expanding Arrays of Fine Pad Pitch Devices to Test Under Wide Temperature Range Pouya Dastmalchi, PhD, and Cameron Harker (Formfactor – USA) Presented by Pouya Dastmalchi, PhD (Formfactor – USA) |
13:45 – 14:15 Space Available Seating | TestGeni – Test Development Intelligent Automation Senthil Kumar Dhamodharan, Nachiappan Gnanasambandam, and Vaishnavi Saravanan (Caliber Interconnect Solutions Pvt Ltd – India) |
14:15 – 14:45 Space Available Seating | Advanced Testing Technology for Future Requirement Scott Huang (Kore Semiconductor Co., Ltd. – China) |
14:45 – 15:30 – PM Tea Break in EXPO Hall
14:45 – 18:00 – SWTest Asia EXPO Open
Technical Session 2: Meeting Process Challenges
Session Chair: Alex Yang (MPI Corporation – Taiwan)
15:30 – 16.00 Space Available Seating | Thermal Stability and Properties Of PALYSIUM – Revolutionary Probe Material Dr. Jonas Fecher (Heraeus Deutschland GmbH & Co. KG – Germany) |
16:00 – 16:30 Space Available Seating | New Generation of Kelvin Spring Pins Lambert Brost (Technoprobe – USA) Presented by Ming-Ting Wu (Technoprobe – Taiwan) |
16:30 – 17:00 Space Available Seating | Probe Card Market Dynamics in a Turbulent World John West and Lin Fu (Yole Intelligence – United Kingdom) |
17:00 – 18:00 – Welcome Reception in Expo Hall
Friday, October 28
8:00 – 14:00 | Attendee Registration Open |
9:00 – 9:15 | Chair’s Opening Remarks for SWTest Asia 2022 Dr. Jerry Broz, SWTest General Chair Clark Liu, SWTest Technical Program Chair |
9:15 – 10:15 Space Available Seating | Friday Keynote Presentation in General Session Room Semiconductor, the Information and Communication Technology (ICT) Supply Chain and Geopolitics ![]() Digitimes Founder and Chairman |
10:00 – 16:00 | SWTest Asia Expo Open |
10:15 – 11:00 | AM Tea Break in EXPO Hall |
Technical Session 3: Test Challenges and Solutions
Session Chair: Dr. Jerry Broz, General Chair (Advanced Probing Systems – USA)
11:00 – 11:30 Space Available Seating | Validation of 55GHz Octal-site Wafer Test Probecard for 5G mmWave device Peter Cockburn (Cohu, Inc. – United Kingdom) |
11:30 – 12:00 Space Available Seating | Aging parametric testers versus determining measurement system vitality Mike Palumbo (Technoprobe – USA) Presented by Jeff Arasmith (Technoprobe America Inc. – San Jose, USA) |
12:00 – 12:30 Space Available Seating | High Parallelism Probe Card on V93K Direct-Probe™ System to Increase Testing Throughput on Automotive IC John Kao (Formfactor – Taiwan) |
12:30 – 14:00 – Expo Open – Lunch in Expo Hall – Two Sessions (12:30 – 13:15 & 13:15 – 14:00)
Technical Session 4: Power, Magnets, and Memory
Session Chair: Dr. Alan Ferguson (Oxford Lasers – United Kingdom)
14:00 – 14:30 Space Available Seating | Testing challenges for latest SiC and GaN devices Elia Petrogalli (SPEA S.p.A. – Italy) |
14:30 – 15:00 Space Available Seating | Wafer Level Magnetic Testing of STT-MRAM for Process Control and Chip Sorting in Volume Manufacturing Siamak Salimy (Hprobe – France) and Henry Chung (HTSI – Taiwan) |
15:00 – 15:30 Space Available Seating | Next Generation DRAM Temperature Requirements and Impacts to Full Wafer Contactor Probe Card Performance Myung Jin Lee (FormFactor – USA) and Hyun Ae Lee (Samsung Electronics – Korea) |
15:30 – 16:00 – PM Tea Break in EXPO Hall
Technical Session 5: Testing for the Next Generation
Session Chair: Joey Wu (SWTest Asia Committee Member – Taiwan)
16:00 – 16:30 Space Available Seating | Challenges and Improvement Actions for HPC Wafer Testing Oscar Lee, Harvey Lin, and Hung I Tsai (TSMC – Taiwan) |
16:30 – 17:00 Space Available Seating | Known Good Die Memory Wafter Test Challenge Beyond DDR5 4GHz/8Gbps Speed Alan Liao (FormFactor – USA) |
17:00 – 17:30 Space Available Seating | High wattage dissipation under temperature – a new method for test evaluation Klemens Reitinger (ERS electronic GmbH – Germany) |
17:30 – 17:45 Space Available Seating | Awards for Best Presentations |
17:45 – 18:45 | Closing Reception in Expo Hall |
There will be a total of fifteen 30-minute technical papers, 10 hours of Expo, 3 tea breaks, 1 lunch, and 2 receptions.