Committee

SWTest Committee is an international group of experienced probe technologists that volunteer their time and efforts to develop the Technical Program of the conference.  Committee members guide a topical technical agenda by encouraging colleagues, customers, and suppliers to participate and submit their excellent work.  Committee members also work to select presentations, invite additional speakers and presenters, provide tutorials, and coordinate the technical sessions during the conference.  Participation on the SWTest Committee is a purely voluntary activity and technologists interested in becoming a member of the committee and contributing to the success of the SWTest conference should contact the General Chair.

SWTest Chairs

Jerry Broz, PhD
Delphon Industries, General Chair
jerry.broz@swtest.org

Rey Rincon
SWTest Operations Chair
rey.rincon@swtest.org

Patrick Mui
JEM America, Technical Program Chair
patrick.mui@swtest.org

SWTest Asia Program Chairs

  • Nobuhiro Kawamata, FormFactor KK, Japan Program Chair
  • Clark Liu, Taiwan MJC Co., Taiwan Program Chair

SWTest Asia Steering Committee

  • John Caldwell, MJC Electronics Corp (US)
  • Eric Chia-Cheng Chang, PhD, Intel Corporation (US)
  • Alan Ferguson, PhD, Oxford Lasers, Inc. (United Kingdom)
  • BC Kim, Samsung (Korea)
  • JY Kim, TSE (Korea)
  • Kuroki Yoichi, Tera Probe (Japan)
  • Muru Meyyappan, Lattice Semiconductors (US) 
  • Masahide Ozawa, Industrial Advisor (Japan)
  • Masatomo Takahashi, ACCRETECH (Japan)
  • Kenny Tang, TSMC (Taiwan)
  • Nyi Nyi Thein, SanDisk Corporation (US)
  • Joey Wu, Toward Technologies, Inc. (Taiwan)
  • Alex Yang, MPI Corporation (Taiwan)
  • Andrew Yick, PhD, Marvell (US)