SWTest Asia 2018 Program

SWTest Asia 2018 Full eProceedings

Keynote Speakers Presentations

Semiconductor Industry Entering a New Era as the World Finds Ways to Extract More Value from Chips

Dr. Lin Fu, Technical and Market Analyst, and John West, Managing Director, VLSI Research Europe

Facing Test Challenges in Upcoming AI/5G-based Systems Opportunity for Radical Ideas

Dr. Harry Chen
Chair of MediaTek’s Design Technology R&D Lab Mediatek, Inc.

Awarded Presentations

Best Overall Presentation

Overcoming Challenges for 5G Production Tests
Dr. Choon Beng Sia (FormFactor, Inc. – Singapore

Best Data Presented

High Performance CIS Wafer Probing using 2D MEMS Technology
Dr. Yunhwi Park, Kyungsub Kim, Youngjin Kim, and Sungjoon Kang (Korea Instruments – Korea), Chang-Hoon Hyun and Kyushik Min (Samsung Electronics. Co. – Korea)

©2018 swtestasia.org