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SWTest Asia 2018

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Best Overall Presentation

Overcoming Challenges for 5G Production Tests
Dr. Choon Beng Sia (FormFactor, Inc. – Singapore)

Dr. Choon Beng Sia (FormFactor, Inc. – Singapore)

Best Data Presented

High Performance CIS Wafer Probing using 2D MEMS Technology
Dr. Yunhwi Park, Kyungsub Kim, Youngjin Kim, and Sungjoon Kang
(Korea Instruments – Korea)
Chang-Hoon Hyun and  Kyushik Min
(Samsung Electronics. Co. – Korea)

Dr. Yunhwi Park (Korea Instruments – Korea)

Thursday Keynote

Semiconductor Industry Entering a New Era as the World Finds Ways to Extract More Value from Chips
Dr. Lin Fu, Technical and Market Analyst, and John West, Managing Director, VLSI Research Europe

Dr. Lin Fu, Technical and Market Analyst, and John West, Managing Director, VLSI Research Europe

Friday Keynote

Facing Test Challenges in Upcoming AI/5G-based Systems Opportunity for Radical Ideas
Dr. Harry Chen, Chair of MediaTek’s Design Technology R&D Lab, Mediatek, Inc.

Dr. Harry Chen, Chair of MediaTek’s Design Technology R&D Lab, Mediatek, Inc.