Archives

SWTest Asia 2019

Keynote Speakers Presentations

“Industry 3.5” to Empower Intelligent Manufacturing and Empirical Studies in Taiwan (PDF)
Chen-Fu Chien, Ph.D.
Tsinghua Chair Professor & Micron Chair Professor
Department of Industrial Engineering & Engineering Management
National Tsing Hua University, Hsinchu 30013, Taiwan

Wafer Test Value and Future (PDF)
Masahide Ozawa
Technical Consultant
Tokyo Electron Technology Solutions

Technical Program eProceedings

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Awarded Presentations

 

Most Inspirational

A New Framework To Manage Device Interface Complexity For The Next Decade

Steve Ledford (Teradyne – USA)

Best Data Presentation

5g Enhanced Micro-Cantilever Membrane Probing Solutions

Jed Hsu and Jordan Smalls (Translarity, Inc. – USA)

Best Overall Presentation

Takumi CL – New 2D-MEMS Spring Introduction to Formfactor Parametric Probe Card and Comparison with 3D MEMS Spring

Takao Saeki (Formfactor, K.K. – Japan)

SWTest Asia 2018

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Best Overall Presentation

Overcoming Challenges for 5G Production Tests
Dr. Choon Beng Sia (FormFactor, Inc. – Singapore)

Dr. Choon Beng Sia (FormFactor, Inc. – Singapore)

Best Data Presented

High Performance CIS Wafer Probing using 2D MEMS Technology
Dr. Yunhwi Park, Kyungsub Kim, Youngjin Kim, and Sungjoon Kang
(Korea Instruments – Korea)
Chang-Hoon Hyun and  Kyushik Min
(Samsung Electronics. Co. – Korea)

Dr. Yunhwi Park (Korea Instruments – Korea)

Thursday Keynote

Semiconductor Industry Entering a New Era as the World Finds Ways to Extract More Value from Chips
Dr. Lin Fu, Technical and Market Analyst, and John West, Managing Director, VLSI Research Europe

Dr. Lin Fu, Technical and Market Analyst, and John West, Managing Director, VLSI Research Europe

Friday Keynote

Facing Test Challenges in Upcoming AI/5G-based Systems Opportunity for Radical Ideas
Dr. Harry Chen, Chair of MediaTek’s Design Technology R&D Lab, Mediatek, Inc.

Dr. Harry Chen, Chair of MediaTek’s Design Technology R&D Lab, Mediatek, Inc.