SWTest Asia 2022
SWTest Asia 2022 Archives
October 26-28, 2022
SWTest Asia 2019
Keynote Speakers Presentations
“Industry 3.5” to Empower Intelligent Manufacturing and Empirical Studies in Taiwan (PDF)
Chen-Fu Chien, Ph.D.
Tsinghua Chair Professor & Micron Chair Professor
Department of Industrial Engineering & Engineering Management
National Tsing Hua University, Hsinchu 30013, Taiwan
Wafer Test Value and Future (PDF)
Masahide Ozawa
Technical Consultant
Tokyo Electron Technology Solutions
Technical Program eProceedings
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Awarded Presentations
Most Inspirational
A New Framework To Manage Device Interface Complexity For The Next Decade
Steve Ledford (Teradyne – USA)
Best Data Presentation
5g Enhanced Micro-Cantilever Membrane Probing Solutions
Jed Hsu and Jordan Smalls (Translarity, Inc. – USA)
Best Overall Presentation
Takumi CL – New 2D-MEMS Spring Introduction to Formfactor Parametric Probe Card and Comparison with 3D MEMS Spring
Takao Saeki (Formfactor, K.K. – Japan)
SWTest Asia 2018
- Download SWTest Asia 2018 unlocked eProceedings (pdf)
- Download Thursday Keynote by Dr. Lin Fu (Sr. Analyst) and John West (Director) of VLSIResearch
“Semiconductor Industry – Entering a New Era as the World Finds Ways to Extract More Value from Chips” - Download Friday Keynote by Dr. Harry H. Chen (IC Testing Scientist) of MEDIATEK Computing and Artificial Intelligence Technology Group
“Facing Test Challenges in Upcoming AI/5G-based Systems – Opportunity for Radical Ideas”
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Best Overall Presentation
Overcoming Challenges for 5G Production Tests
Dr. Choon Beng Sia (FormFactor, Inc. – Singapore)
Dr. Choon Beng Sia (FormFactor, Inc. – Singapore)
Best Data Presented
High Performance CIS Wafer Probing using 2D MEMS Technology
Dr. Yunhwi Park, Kyungsub Kim, Youngjin Kim, and Sungjoon Kang
(Korea Instruments – Korea)
Chang-Hoon Hyun and Kyushik Min
(Samsung Electronics. Co. – Korea)
Dr. Yunhwi Park (Korea Instruments – Korea)
Thursday Keynote
Semiconductor Industry Entering a New Era as the World Finds Ways to Extract More Value from Chips
Dr. Lin Fu, Technical and Market Analyst, and John West, Managing Director, VLSI Research Europe
Dr. Lin Fu, Technical and Market Analyst, and John West, Managing Director, VLSI Research Europe
Friday Keynote
Facing Test Challenges in Upcoming AI/5G-based Systems Opportunity for Radical Ideas
Dr. Harry Chen, Chair of MediaTek’s Design Technology R&D Lab, Mediatek, Inc.
Dr. Harry Chen, Chair of MediaTek’s Design Technology R&D Lab, Mediatek, Inc.
