Jerry Broz, PhD
SWTest General Chair
Clark Liu
SWTest Technical Program Chair
Session Chair: Clark Liu (MJC Taiwan – Taiwan)
Pouya Dastmalchi, PhD, and Cameron Harker (Formfactor – USA)
Presented by Pouya Dastmalchi, PhD (Formfactor – USA)
Senthil Kumar Dhamodharan, Nachiappan Gnanasambandam, and Vaishnavi Saravanan (Caliber Interconnect Solutions Pvt Ltd – India)
Scott Huang (Kore Semiconductor Co., Ltd. – China)
Session Chair: Alex Yang (MPI Corporation – Taiwan)
Dr. Jonas Fecher (Heraeus Deutschland GmbH & Co. KG – Germany)
Lambert Brost (Technoprobe – USA)
Presented by Ming-Ting Wu (Technoprobe – Taiwan)
John West and Lin Fu (Yole Intelligence – United Kingdom)
Session Chair: Dr. Jerry Broz, General Chair (Advanced Probing Systems – USA)
Peter Cockburn (Cohu, Inc. – United Kingdom)
Mike Palumbo (Technoprobe – USA)
Presented by Jeff Arasmith (Technoprobe America Inc. – San Jose, USA)
John Kao (Formfactor – Taiwan)
Session Chair: Dr. Alan Ferguson (Oxford Lasers – United Kingdom)
Elia Petrogalli (SPEA S.p.A. – Italy)
Siamak Salimy (Hprobe – France) and Henry Chung (HTSI – Taiwan)
Myung Jin Lee (FormFactor – USA) and Hyun Ae Lee (Samsung Electronics – Korea)
Session Chair: Joey Wu (SWTest Asia Committee Member – Taiwan)
Oscar Lee, Harvey Lin, and Hung I Tsai (TSMC – Taiwan)
Alan Liao (FormFactor – USA)
Klemens Reitinger (ERS electronic GmbH – Germany)